Fluorescent X-ray Film Thickness Measurement System 'Mekki-Note'
【Compatible with domestic and overseas X-ray fluorescence thickness gauges!】 Achieve significant reduction in work time through automatic input of measurement values from the X-ray fluorescence thickness gauge and automatic issuance of test reports!
The "Mekki-Note" is a system that records inspection results based on the plating thickness measured by a fluorescent X-ray thickness gauge. It manages the measurement locations within the system, allowing for automatic input from the fluorescent X-ray thickness gauge and the output of test reports. Additionally, it can generate Xbar-R control charts based on the recorded data, making it useful for quality control. 【Features】 ■ Significant reduction in work time and labor costs achieved through automatic input of measurement values from the fluorescent X-ray device and automatic issuance of test reports. ■ Automation helps prevent data tampering and reduces human errors. ■ Supports small-batch production of various products by mastering measurement locations and inspection items for each product. ■ Instant output of Xbar-R control charts made possible by database management of measurement values. *For more details, please request documentation or view the PDF data available for download.
- Company：ＳＡＹコンピュータ
- Price：Other
